CVE-2024-53017

{"id": "CVE-2024-53017", "cveTags": [], "metrics": {"cvssMetricV31": [{"type": "Primary", "source": "product-security@qualcomm.com", "cvssData": {"scope": "UNCHANGED", "version": "3.1", "baseScore": 6.6, "attackVector": "LOCAL", "baseSeverity": "MEDIUM", "vectorString": "CVSS:3.1/AV:L/AC:L/PR:L/UI:N/S:U/C:L/I:H/A:L", "integrityImpact": "HIGH", "userInteraction": "NONE", "attackComplexity": "LOW", "availabilityImpact": "LOW", "privilegesRequired": "LOW", "confidentialityImpact": "LOW"}, "impactScore": 4.7, "exploitabilityScore": 1.8}]}, "published": "2025-06-03T06:15:24.793", "references": [{"url": "https://docs.qualcomm.com/product/publicresources/securitybulletin/june-2025-bulletin.html", "source": "product-security@qualcomm.com"}], "vulnStatus": "Awaiting Analysis", "weaknesses": [{"type": "Primary", "source": "product-security@qualcomm.com", "description": [{"lang": "en", "value": "CWE-823"}]}], "descriptions": [{"lang": "en", "value": "Memory corruption while handling test pattern generator IOCTL command."}, {"lang": "es", "value": "Corrupci\u00f3n de memoria durante el manejo del comando IOCTL del generador de patrones de prueba."}], "lastModified": "2025-06-04T14:54:33.783", "sourceIdentifier": "product-security@qualcomm.com"}